Author Meyer, Tobias

1 to 7 of 7 Items
  • 2022 Journal Article
    ​ ​Ablation threshold of GaN films for ultrashort laser pulses and the role of threading dislocations as damage precursors​
    Bornemann, S.; Meyer, T.; Voss, T. & Waag, A.​ (2022) 
    Optics Express30(26) art. 47744​.​ DOI: https://doi.org/10.1364/OE.471111 
    Details  DOI 
  • 2022 Journal Article | 
    ​ ​Atomistic Insights into Activation and Degradation of La0.6Sr0.4CoO3−δ Electrocatalysts under Oxygen Evolution Conditions​
    Weber, M. L.; Lole, G.; Kormanyos, A.; Schwiers, A.; Heymann, L.; Speck, F. D. & Meyer, T. et al.​ (2022) 
    Journal of the American Chemical Society, art. jacs.2c07226​.​ DOI: https://doi.org/10.1021/jacs.2c07226 
    Details  DOI 
  • 2023 Journal Article
    ​ ​Microstructural analysis of GaN films grown on (1 0 0) MgF2 substrate by 4D nanobeam diffraction and energy-dispersive X-ray spectrometry​
    Niemeyer, T.; Meyer, K.; Flathmann, C.; Meyer, T.; Schaadt, D. M. & Seibt, M.​ (2023) 
    Journal of Crystal Growth602 art. 126972​.​ DOI: https://doi.org/10.1016/j.jcrysgro.2022.126972 
    Details  DOI 
  • 2023 Journal Article
    ​ ​Interface-Assisted Room-Temperature Magnetoresistance in Cu-Phenalenyl-Based Magnetic Tunnel Junctions​
    Jha, N.; Pariyar, A.; Parvini, T. S.; Denker, C.; Vardhanapu, P. K.; Vijaykumar, G. & Ahrens, A. et al.​ (2023) 
    ACS Applied Electronic Materials5(3) pp. 1471​-1477​.​ DOI: https://doi.org/10.1021/acsaelm.2c01428 
    Details  DOI 
  • 2023 Journal Article
    ​ ​Contrasting Pr 1– x Ca x MnO 3 OER Catalysts with Different Valences and Covalences​
    Lole, G.; Ebrahimi, F.; Meyer, T.; Mierwaldt, D.; Roddatis, V.; Geppert, J. & Risch, M. et al.​ (2023) 
    The Journal of Physical Chemistry C127(1) pp. 177​-186​.​ DOI: https://doi.org/10.1021/acs.jpcc.2c05622 
    Details  DOI 
  • 2023 Journal Article | 
    ​ ​Composition and electronic structure of ${\rm SiO}_{\rm x}$/${\rm TiO}_{\rm y}$/Al passivating carrier selective contacts on n-type silicon solar cells​
    Flathmann, C.; Meyer, T.; Titova, V.; Schmidt, J. & Seibt, M.​ (2023) 
    Scientific Reports13(1).​ DOI: https://doi.org/10.1038/s41598-023-29831-2 
    Details  DOI 
  • 2023 Journal Article
    ​ ​Parasitic AlxOyNz surface defects on high-temperature annealed AlN and their role in hillock formation​
    Peters, L.; Meyer, T.; Margenfeld, C.; Spende, H. & Waag, A.​ (2023) 
    Applied Physics Letters123(11) art. 112104​.​ DOI: https://doi.org/10.1063/5.0170006 
    Details  DOI 

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